| Features |
Benefits |
Imaris
Surpass |
Imaris MeasurementPro |
SurpassTopo |
| Surpass:
Overview |
allows to
understand complex data by simultaneous combination of various
visualization techniques |
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Combination of all
objects in Surpass: volume, isosurface, orthogonal slice, clipping plane,
external object, light source |
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Combination of topographic surface
with all Surpass objects (with ImarisSurpass license) |
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measurement points |
User can position measurement points interactively in 3D. User sees
what she/he measures. |
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group
manipulations: visible/invisible, delete, color and material
editor |
Make sets of
object visible/invisible at once. Measure stats for entire
group. |
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export and import of complex scenes
(arrangement of objects with material parameters) |
allows interruption of work, allows
identical processing of different data sets |
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| Volume |
allows combined
visualization of fine structures together with objects stained with
another dye (reduced to an isosurface) |
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maximum intensity
projection (MIP) |
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real-time
alpha-blending for lowest or highest gray values |
evaluate threshold
value for isosurface |
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contrast
manipulation individually for each channel |
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| Isosurface |
reduction of raw data to separated
objects, which can be treated and visualized individually
User can select and work with "his"
biological objects rather than with entire images. |
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controlled
isosurface calculation by choice of threshold, channel, resampling size,
filter size, number and size of created objects |
Detailed control on separation of
data into smaller objects.
Allows to reduce need for computer resources by avoiding unproductive
(void) resolution. |
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color and material
editor for each object |
facilitates
distinction of objects |
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fast rebuild with
another threshold |
fast
trial-and-error for finding the correct calculation parameters |
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triangle reduction after
generation |
reduce data size and gain display
speed |
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export in Inventor file format
(*.iv) |
comparison with surfaces in other
data sets |
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output of volume and surface
area |
fast information about
objects |
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statistical analysis of gray values
included in isosurfaces: minimum, maximum, mean value, total mass, center
of mass |
allows quantitative and comparative
analysis of stained structured |
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export of statistics into
EXCEL-readable file |
fast statistical analysis |
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| Orthogonal Slice |
allows fast and
easy overview about data set |
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arbitrary number
of parallel or orthogonal slices |
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multiple
channels |
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| Clipping
Plane |
allows
visualization of dense data |
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invisibility of
all mass in front of clipping plane with fast on/off |
view inside of
complex, dense objects |
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orthogonal or
oblique position relative to data set |
gain information
which is not restricted to main coordinate axes |
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save and restore
position |
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| External
object |
allows comparison
studies |
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import of Inventor
file format, VRML, DXF |
comparison with
exported surfaces from another data set |
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movement and size
change |
comparison of
shape and size |
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| Light Source |
special light
effects for all surfaces |
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connect position
with data set or fix in space |
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edit color and
intensity |
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| Interoperability |
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snapshot output
using standard tiff format |
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statistical output
in EXCEL-readable format |
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data exchange with
image database (ImageAccess) |
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| Measurement
points |
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interactive 3D distance
measurement |
Users sees what he measures. Unique feature. |
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3D length measurement with a
polyline |
length measurement of curved
structures, e.g. filaments |
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fixing of measurement points to
isosurfaces and orthogonal slice |
very easy handling |
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